KAMELO (U.S. Trademark Serial Number 97484124) is a United States trademark of ISLA GLOBAL CO., LTD.. The goods and services include: The mark consists of a wavy line enclosed by part of a circle on top of a curved line with stylized wording KameLo. Reflecting articles for wear, for the prevention of accidents; Articles of…
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MICA NODE (U.S. Trademark Serial Number 97484116) is a United States trademark of GenXComm Inc.. The goods and services include: Optical filters; Optical semiconductors; Telecommunications equipment, namely, fiber-optic transceivers, fiber optic repeaters, converters and optimizers, wave division multiplexers, free-space optics transmission systems, switches including Ethernet switches and routers, fiber-to-the-home and ethernet-over-VDSL access aggregators, terminators and…
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DACORM (U.S. Trademark Serial Number 97484106) is a United States trademark of Wang, Yiting. The goods and services include: Adjustable smartphone and PC tablet stabilizers and mounts; Batteries and battery chargers; Cases for smartphones; Cell phone battery chargers; Cell phone cases; Cell phone covers; Chargers for batteries; Covers for smartphones; Ear phones; Ear plugs for…
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GXC COBALT (U.S. Trademark Serial Number 97484107) is a United States trademark of GenXComm Inc.. The goods and services include: Optical filters; Optical semiconductors; Telecommunications equipment, namely, fiber-optic transceivers, fiber optic repeaters, converters and optimizers, wave division multiplexers, free-space optics transmission systems, switches including Ethernet switches and routers, fiber-to-the-home and ethernet-over-VDSL access aggregators, terminators and…
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TAT (U.S. Trademark Serial Number 97484101) is a United States trademark of ETRON TECHNOLOGY, INC.. The goods and services include: Semiconductor wafers; Semiconductor chips; Integrated circuits; Integrated circuit modules; Dynamic random access memory (DRAM); Static random access memory (SRAM) Design and testing of semiconductors and integrated circuits for others; Design and testing of semiconductor chips…
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